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Planar Biaxial Testing Machine with fluid bath and digital image correlation

ADMET DIC Digital Image Correlation System

ADMET DIC system is a fully integrated solution that utilizes optimized correlation algorithms to provide non-contact, full-field, two-dimensional displacement and strain data for mechanical testing on planar specimens. In-plane displacements are measured at every point within the area of interest, and the full-field strain field is computed and displayed to easily identify strain concentrations. 

Specimen sizes ranging from microscopic to very large scale can be measured by simply adjusting optics. Sub-micron displacements can be measured, and local strains from 50 microstrain to over 2500% are achievable with extremely low noise levels and high accuracy. 

Digital Image Correlation (DIC) system analysis software includes post-processing features such as minimum/maximum, mean and standard deviation, time-slice extraction, stress-strain curve generation, data extraction along lines and more.

Optical surface deformation measurements can be used for but not limited to material testing including fracture mechanics, biaxial and tensions tests, FEA validation such as strain localization around cracks and notches and general component testing.

  • Full-field measurement of in-plane displacements & strains
    • X & Y coordinates
    • X & Y displacements
    • In-plane velocities
    • Strain rate, major and minor strains
  • 2D or 3D Imaging Options
  • High strain resolution: down to 0.001% (10 microstrain)
  • Strain measurement: 2,000% or higher possible
  • In-plane resolution: 1/100,000 * FOV or better
  • Automatic start point detection
  • Intuitive Area of Interest (AOI) editor
  • Create custom variables with custom formulas
  • Rigid body motion removal tool
  • In-plane rotation computation
  • Time filter options
  • No calibration required for strain computation
  • Sample size from nanometers to >100 m possible
  • 1/100th pixel motion resolution
  • Synchronized analog data acquisition
  • Readings through ADMET MTESTQuattro software
  • Easy data exporting (CSV, STL, ACII, Matlab, etc.)

ADMET testing systems equipped with our DIC packages come with one or two high-resolution cameras (2D or 3D) that allow operators to perform strain rate-controlled testing using virtual extensometer points. Once the test specimen is placed in the test area, cameras are set up to record the strain field selected for further analysis. 

ADMET’s advanced MTESTQuattro controller has the ability to trigger the external cameras during a test through one of its three outputs and acquire strain readings from the DIC software that generates the strain field and measures in-plane displacements and strains.

The live axial or transverse strain reading feed right into MTESTQuattro with the proper cabling provided. The operator can easily identify strain distributions from the image-overlay contour plots or contour plots independently. MTESTQuattro records the strain readings and makes the data available for performing strain rate-controlled tests which is required for tests such as ASTM E8.

  • Choose DIC-2D system with one camera or the DIC-3D system with two cameras
  • Easily identify critical points and unrecognized areas of high stress/strain by analyzing the entire area of a specimen rather than a single point
  • Comes with image acquisition and analysis software preinstalled on a desktop or laptop computer. An additional license will be provided on a USB dongle. This dongle permits the execution of the analysis software on any computer the user chooses
  • Use ADMET advanced MTESTQuattro software to record strain readings and perform strain-rate controlled tests 
  • Customize your system to meet your testing parameters. Whether your application requires high magnification or high-speed data acquisition, we have a solution for you
  • Multiple variables can be viewed on contour plots at the extraction locations
  • An unlimited number of data extractions can be saved with the project
  • Extraction points can be displayed on contour plots with customizable labels
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